Commercialization Potential for Deep Machine Learning Technology Using Line Scan Camera

von Satreviès, Vladimirs
Veröffentlicht in WMSCI (24. : 2020 : Online) 24th World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI 2020) ; Volume 3 of 3 (2020)

Opportunities Using Deep Machine Learning Technology Quality Control Inspection

von Satreviés, Vladimirs
Veröffentlicht in WMSCI (24. : 2020 : Online) 24th World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI 2020) ; Volume 3 of 3 (2020)