Origin of Semiconductive Conduction in Fe1_xCuxCr2S4(0 <x <0.5): An Interpretation of Mössbauer Spectra of FE0-89Cu0.02Cr2S4

von ANDO, K.
Veröffentlicht in International Conference on Ternary and Multinary Compounds (4 : 1980 : Tokio) Proceedings of the 4th International Conference on Ternary and Multinary Compounds (1981)

Detecting Basal Plane Dislocations Converted in Highly Doped Epilayers

von Nishihara, Y.
Veröffentlicht in European Conference on Silicon Carbide and Related Materials (12. : 2018 : Birmingham) Silicon carbide and related materials 2018 (2019)

Evaluation of Suppressing Forward Voltage Degradation by Using a Low BPD Densitv Substrate or an Epitaxial Wafer with an HNDE

von Nishihara, Y.
Veröffentlicht in International Conference on Silicon Carbide and Related Materials (18. : 2019 : Kyōto) Silicon carbide and related materials 2019 (2020)