NTS1.6: Next Generation Solutions for Micro Edge Crack Detection

von Mock, Brian
Veröffentlicht in TAPPICon LIVE (2021 : Atlanta, Ga) TAPPICon LIVE 2021 ; Volume 1 of 2 (2022)

ADVANCES IN OFF THE SHELF CAMERA TECHNOLOGY PROVIDE PAPERMAKERS WITH BETTER TOOLS TO INCREASE PAPER MACHINE OEE

von Mock, Brian
Veröffentlicht in PaperCon (2019 : Indianapolis, Ind.) Paper Conference and Trade Show (PaperCon 2019) ; Volume 1 of 2 (2020)

HOW DEEP LEARNING IS USED TO INCREASE THE QUALITY CONTROL OF WOOD CHIPS BY CLASSIFICATION

von Mock, Brian
Veröffentlicht in PaperCon (2019 : Indianapolis, Ind.) Paper Conference and Trade Show (PaperCon 2019) ; Volume 1 of 2 (2020)

HOW DEEP LEARNING IS USED TO INCREASE THE QUALITY CONTROL OF WOOD CHIPS BY CLASSIFICATION

von Mock, Brian
Veröffentlicht in Pulping, Engineering, Environmental and Recycling Sustainability Conference (2019 : St. Louis, Mo.) Pulping, Engineering, Environmental and Recycling Sustainability Conference (PEERS 2019) (2020)

PC38.2: How Deep Learning is Used to Increase the Quality Control of Wood Chips by Classification. Phase II - Model Development and Application Results

von Mock, Brian
Veröffentlicht in TAPPICon LIVE (2021 : Atlanta, Ga) TAPPICon LIVE 2021 ; Volume 2 of 2 (2022)