Effective Range of Observable Depth by Electron-Acoustic Microscopy Using Two-Phase Electron Acoustic Signals

von TAKENOSHITA, Hiroshi
Veröffentlicht in Symposium on Ultrasonic Electronics (12 : 1991 : Tokio) Proceedings of the 12th Symposium on Ultrasonic Electronics (1992)

Observation of Dislocation Lines in a Transistor by Electron-Acoustic Microscopy

von TAKENOSHITA, Hiroshi
Veröffentlicht in Symposium on Ultrasonic Electronics (5 : 1984 : Tokio) Proceedings of the 5th Symposium on Ultrasonic Electronics (1985)