Electrical and Optical Characteristics of WOx, ZrHfO, and Tri-Layer WOx Embedded ZrHfO High-k Based SSI-LEDs

von Lin, W. S.
Veröffentlicht in ECS Meeting (239. : 2021 : Online) (22.) Wide Bandgap Semiconductor Materials and Devices 22 (2021)

Gate Electrode Material Effect on Characteristics of Zirconium-Doped Hafnium Oxide High-k MOS Capacitors

von Lin, W. S.
Veröffentlicht in ECS Meeting (237. : 2020 : Montréal) (19.) Advanced CMOS-Compatible Semiconductor Devices 19 (2020)