FeatEMD: Better Patch Sampling and Distance Metric for Few-Shot Image Classification

von Deng, Shisheng
Veröffentlicht in ICANN (32. : 2023 : Heraklion; Online) Artificial neural networks and machine learning - ICANN 2023 ; Part 1 (2023)

Improving Few-Shot Image Classification with Self-supervised Learning

von Deng, Shisheng
Veröffentlicht in SCF (2022 : Honolulu) Cloud computing - CLOUD 2022 (2022)

Deep Density-Aware Count Regressor

von Chen, Zhuojun
Veröffentlicht in European Conference on Artificial Intelligence (24. : 2020 : Online) ECAI 2020 ; Part 4 (2020)