Electrooptical interactions in FinFETs

von Krishnan, Ravikumar Venkat
Veröffentlicht in International Symposium for Testing and Failure Analysis (48. : 2022 : Pasadena, Calif.) 48th International Symposium for Testing and Failure Analysis (ISTFA 2022) ; Volume 1 of 2 (2023)

Dynamic Photon Emission on FinFET Devices Through Novel Scan Test Approaches

von Gopinath, Ranganathan
Veröffentlicht in International Symposium for Testing and Failure Analysis (45. : 2019 : Portland, Or.) ISTFA 2019 (2019)