Nanoprobe Characterization of Soft SRAM Bit Fails in Advanced Technologies

von Kodali, Satish
Veröffentlicht in International Symposium for Testing and Failure Analysis (45. : 2019 : Portland, Or.) ISTFA 2019 (2019)

Capacitance Characterization of Gate to LDD Overlap Region to Understand Subtle Fail Modes in Advanced Node Technologies

von Kodali, Satish
Veröffentlicht in International Symposium for Testing and Failure Analysis (45. : 2019 : Portland, Or.) ISTFA 2019 (2019)