Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology

von Klapetek, Petr
Veröffentlicht 2018

VERIFICATION OF NANOINDENTATION DEVICES USING ATOMIC FORCE MICROSCOPY

von CAMPBELL, Anna CHARVATOVA
Veröffentlicht in NANOCON (11. : 2019 : Brünn) 11th International Conference on Nanomaterials - Research and Application (NANOCON 2019) (2020)

AFM CHARACTERIZATION OF NANOCOMPOSITE SAMPLES

von CAMPBELL, Anna CHARVÁTOVÁ
Veröffentlicht in NANOCON (12. : 2020 : Brünn) 12th International Conference on Nanomaterials - Research and Application (NANOCON 2020) (2021)

STUDY OF NANOSTRUCTURED PLASMA-POLYMER THIN FILMS GROWTH UNDER DUSTY PLASMA CONDITIONS

von HOMOLA, Vojtech
Veröffentlicht in NANOCON (11. : 2019 : Brünn) 11th International Conference on Nanomaterials - Research and Application (NANOCON 2019) (2020)