DATA PROCESSING SYSTEM FOR HIGH RELIABILITY ASSURANCE

von JINNO, Takamitsu
Veröffentlicht in Symposium on Reliability and Maintainability (4. : 1974 : Tokio) 4th Symposium on Reliability and Maintainability (1974)

A Method for Preventing Charging-up Observed in Electron Beam Testing of Passivated LSI Devices

von Watanabe, Yoshio
Veröffentlicht in Symposium on Reliability and Maintainability (14. : 1984 : Tokio) 14th Symposium on Reliability and Maintainability (1984)

Reliability Data Base of Electronic Components

von Kaizu, Katsumi
Veröffentlicht in Symposium on Reliability and Maintainability (16. : 1986 : Tokio) 16th Symposium on Reliability and Maintainability (1986)