VALIDATION OF A SIMPLE MODEL USING THE DISTINCT ELEMENT METHOD FOR NUMERICAL SIMULATIONS OF SLOPE COLLAPSE

von Nakase, Hitoshi
Veröffentlicht in SMiRT (25. : 2019 : Charlotte, NC) 25th International Conference on Structural Mechanics in Reactor Technology 2019 (SMiRT 25) ; Volume 2 of 5 (2020)

Development of Fully Silicided Gate Technology in Metal/High-k MOSFETs

von Nabatame, T.
Veröffentlicht in Handōtai-Shūseki-Kairo-Gijutsu-Shinpojiumu (68 : 2005 : Kyōto) Handōtai, Shuseki-Kairo-Gijutsu-68.-Shinpojiumu-kōen-ronbunshū (2005)

Electrical properties and structure of HfAlOx/HfA1Ox(N) films prepared by LL-D & A process

von Nabatame, T.
Veröffentlicht in Handōtai-Shūseki-Kairo-Gijutsu-Shinpojiumu (65 : 2003 : Tokio) Handōtai, Shuseki-Kairo-Gijutsu-65.-Shinpojiumu-kōen-ronbunshū (2003)