Edge Detection Using K-means and Run-Based Two-Scan Connected Components labeling adapted for grayscale images

von Avni, Chen
Veröffentlicht in MLDM (Veranstaltung : 15. : 2019 : New York, NY) 15th International Conference Machine Learning and Data Mining in Pattern Recognition ; Volume 2 of 2 (2020)

A New Approach for Tuned Clustering Analysis

von Ishay, Roni Ben
Veröffentlicht in MLDM (Veranstaltung : 14. : 2018 : New York, NY) Machine learning and data mining in pattern recognition ; Part 1 (2019)