Reciprocal Space Map Measurement of Ceramics Thin Films for Unequal Lattice Change at High Temperature

von Saiki, A.
Veröffentlicht in International Conference on the Physical Properties and Application of Advanced Materials (13. : 2018 : Hanoi) Physical properties and application of advanced materials (2020)

Study of HfO2-Based High-k Gate Insulators for GaN Power Device

von Nabatame, T.
Veröffentlicht in Symposium on Semiconductor Process Integration (12. : 2021 : Online) Semiconductor Process Integration 12 (2021)