Gate Oxide Reliability of SiC MOSFETs and Capacitors Fabricated on 150mm Wafers

von Lichtenwalner, D. J.
Veröffentlicht in European Conference on Silicon Carbide and Related Materials (12. : 2018 : Birmingham) Silicon carbide and related materials 2018 (2019)

Industrial and Body Diode Qualification of Gen-III Medium Voltage SiC MOSFETs: Challenges and Solutions

von Brunt, E. van
Veröffentlicht in European Conference on Silicon Carbide and Related Materials (12. : 2018 : Birmingham) Silicon carbide and related materials 2018 (2019)

Accelerated Testing of SiC Power Devices under High-Field Operating Conditions

von Lichtenwalner, D. J.
Veröffentlicht in International Conference on Silicon Carbide and Related Materials (18. : 2019 : Kyōto) Silicon carbide and related materials 2019 (2020)