IPACK2018-8219 Design and Calibration of Resistive Stress Sensors on 4H Silicon Carbide

von Jaeger, Richard C.
Veröffentlicht in ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (2018 : San Francisco, Calif.) Proceedings of the ASME International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems - 2018 (2019)