A Finite Element Analysis of Board Level Drop Reliability Test and Analysis of Stress Buffer Effect of Polyimide

von Fujita, Mitsuru
Veröffentlicht in 2013 IEEE CPMT Symposium Japan (formerly VLSI Packaging Workshop of Japan) (2013)

2C01 Photocurrent generation using semiconductor electrodes modified with composites of porphyrin and single-walled carbon nanotubes

von UMEYAMA, Tomokazu
Veröffentlicht in Kōkagaku-Tōronkai-kōen-yōshishū (2007)