Treffer 1 - 20 von 22 für Suche 'Claeys, C.', Suchdauer: 0,26s Treffer weiter einschränken
  1. 1
    Radiation hardening study of displacement damage in silicon
    von Claeys, C.
    Veröffentlicht 1993
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  2. 2
    Radiation hardening study of displacement damage in silicon
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  3. 3
    (Invited) Defect Engineering for Monolithic Integration of III-V Semiconductors on Silicon Substrates
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  4. 4
    Proceedings of the 7th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology : Spa, Belgium, October 5 - 10, 1997
    Veröffentlicht 1997
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  5. 5
    Radiation hardening study of displacement damage in silicon
    von Claeys, C.
    Veröffentlicht 1994
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  6. 6
    ULSI process integration 7 : [Seventh Symposium on ULSI Process Integration held in Boston, MA at the 220th meeting of the Electrochemical Society, October 9 - 14, 2011]
    Veröffentlicht 2011
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  7. 7
    Impact of Processing Factors on the Low-Frequency Noise of Gate-All-Around Silicon Vertical Nanowire FETs
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  8. 8
    Enhanced lightweight NVH solution based on vibro-acoustic metamaterials
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  9. 9
    ULSI process integration 8 : [papers presented at the Eighth Symposium on ULSI Process Integration, held in San Francisco, CA, at the 224th meeting of the Electrochemical Society, October 27 - November 1, 2013]
    Veröffentlicht 2013
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  10. 10
    ULSI process integration 5 : [papers ... presented at the Fifth Symposium on ULSI Process Integration held in Washington, DC at the 212th meeting of the Electrochemical Society, October 7 - 12, 2007]
    Veröffentlicht 2007
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  11. 11
    High purity silicon 9 : [proceedings of the Ninth High Purity Silicon Symposium held in Cancun, Mexico at the 210th meeting of the Electrochemical Society, Oct. 29 - Nov. 3, 2006]
    Veröffentlicht 2006
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  12. 12
    High purity silicon 10 : [proceedings of the Tenth High Purity Silicon Symposium held in Honolulu, Hawaii at the 214th meeting of the Electrochemical Society, October 12 - 17, 2008]
    Veröffentlicht 2008
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  13. 13
    Discussion on the Figures of Merit of Identified Traps Located in the Si Film: Surface Versus Volume Trap Densities
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  14. 14
    Locally Resonant Metamaterial Patches on Rear Shock Towers of a Vehicle to Reduce Structure-Borne Road Noise: Numerical and Experimental Performance Validation
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  15. 15
    High Purity Silicon VI : proceedings of the Sixth International Symposium [held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22 - 27, 2000]
    Veröffentlicht 2000
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  16. 16
    High purity silicon VIII : proceedings of the international symposium ; [held in Honolulu, Hawaii at the 206th meeting of the Electrochemical Society, October 3 - 8, 2004]
    Veröffentlicht 2004
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  17. 17
    Proceedings of the Fifth International Symposium on High Purity Silicon V : [held in Boston, Massachusetts at the 194th Meeting of the Electrochemical Society, November 2 - 6, 1998]
    Veröffentlicht 1998
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  18. 18
    Proceedings of the Fourth International Symposium on High Purity Silicon : [held in San Antonio, Texas at the 190th Meeting of the Electrochemical Society, October 6-11, 1996]
    Veröffentlicht 1996
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  19. 19
    High purity silicon VII : proceedings of the international symposium ; [held at the 202nd meeting of the Electrochemical Society, October 20 - 25, 2002, Salt Lake City, Utah]
    Veröffentlicht 2002
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  20. 20
    ULSI process integration 9
    Veröffentlicht 2015
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