PFIB Delayering—Nanoprobing Workflow on 5nm FinFET Device

von Choi, Ha Young
Veröffentlicht in International Symposium for Testing and Failure Analysis (48. : 2022 : Pasadena, Calif.) 48th International Symposium for Testing and Failure Analysis (ISTFA 2022) ; Volume 1 of 2 (2023)

Characteristics of Ultrafine Particle Emission Change Depending on the Placement of Ventilation Systems in 3D Printer Working Environment

von Park, Kyung-Ho
Veröffentlicht in AIVC Conference (39. : 2018 : Antibes) Smart ventilation for buildings ; Volume 1 of 2 (2020)