Fluorine Induced Reliability Degradation of W-Polycide Gate CMOS Device

von Lee, K.
Veröffentlicht in Handōtai-Shūseki-Kairo-Gijutsu-Shinpojiumu (49 : 1995 : Tokio) 49. Handōtai Shuseki Kairo Gijutsu Shinpojiumu Kōen Ronbunshū (1995)

Fully Coupled Finite Element Analysis of an Automatic Multi-Stage Cold Forging Process

von Byun, J. B.
Veröffentlicht in International Conference on Precision Machinery and Manufacturing Technology (5. : 2020 : Auckland) Materials and technologies in precision machinery III (2020)

Structural Evaluation of CVD WSi[x] and Its Effect on Polycide Line Resistance

von Byun, J.
Veröffentlicht in Handōtai-Shūseki-Kairo-Gijutsu-Shinpojiumu (49 : 1995 : Tokio) 49. Handōtai Shuseki Kairo Gijutsu Shinpojiumu Kōen Ronbunshū (1995)